Noncheckpoint target faults-how to order them?

Author

Gopalakrishnan, K. ; Bhattacharya, Bhargab

Author_Institution

Nebraska Univ., Lincoln, NE, USA

fYear

1991

fDate

14-17 May 1991

Firstpage

619

Abstract

M. Abramovici, P.R. Menon, and D.T. Miller (see IEEE Trans. on Computers, vol.C-35, no.8, p.760-71, Aug. 1986) observed that the checkpoint faults are not sufficient target faults for test generation in combinational circuits and presented an algorithm to select the additional target faults so as to ensure sufficiency. A critical review of their algorithm is presented, and certain disadvantages of that algorithm are brought to light. A revised algorithm incorporating an additional stage of fault simulation and judicious selection of noncheckpoint target faults based on a probabilistic model is developed. The concepts of cover forest and benefit indicators are developed and used effectively in guiding the judicious selection of noncheckpoint target faults, thus minimizing the total number of calls made to the test generation routine

Keywords

combinatorial circuits; fault location; logic testing; benefit indicators; combinational circuits; cover forest; fault simulation; logic testing; noncheckpoint target faults; probabilistic model; test generation; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Fault diagnosis; Redundancy; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1991., Proceedings of the 34th Midwest Symposium on

Conference_Location

Monterey, CA

Print_ISBN

0-7803-0620-1

Type

conf

DOI

10.1109/MWSCAS.1991.252036

Filename

252036