DocumentCode
3399113
Title
Improving boundary element methods for parasitic extraction
Author
Yan, Shu ; Liu, Jianguo ; Shi, Weiping
Author_Institution
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
fYear
2003
fDate
21-24 Jan. 2003
Firstpage
261
Lastpage
267
Abstract
We improve the accuracy and speed of boundary element method (BEM) or multipole accelerated BEM for interconnect parasitic extraction. Three techniques are presented and applied to capacitance extraction: selective coefficient enhancement, variable order multipole and multigrid. Experimental results show that the techniques are effective for extracting parasitics between all pairs of conductors, or between selected pairs of conductors.
Keywords
boundary-elements methods; capacitance; circuit CAD; integrated circuit design; integrated circuit interconnections; boundary element methods; capacitance extraction; conductors; interconnect parasitic extraction; multigrid; multipole accelerated BEM; selected pairs; selective coefficient enhancement; variable order multipole; Acceleration; Boundary element methods; Capacitance; Conductors; Equations; Linear systems; Mathematics; Matrix decomposition; Singular value decomposition; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2003. Proceedings of the ASP-DAC 2003. Asia and South Pacific
Print_ISBN
0-7803-7659-5
Type
conf
DOI
10.1109/ASPDAC.2003.1195027
Filename
1195027
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