• DocumentCode
    3399115
  • Title

    Linear dependency check in built-in test

  • Author

    Yang, Chyan

  • Author_Institution
    Dept. of Electr. & Comput. Eng., US Naval Postgraduate Sch., Monterey, CA, USA
  • fYear
    1991
  • fDate
    14-17 May 1991
  • Firstpage
    615
  • Abstract
    Given a characteristic polynomial and a sampling polynomial with respect to it, whether the sampling polynomial is a dependency polynomial is important to the designer. A dependency polynomial gives low fault coverage in the built-in self test. The tool LDC (linear dependency check) computes the residue combinations of the factors in the set polynomial and advises designers if the sampling polynomial covers all the testing space. When the sampling polynomial is a dependency polynomial, LDC will try to find one, if any, independent polynomial at a minimum cost. In cases of short test vectors, LDC can exhaustively enumerate all independent polynomials for the designers to choose from. The author reviews the basics of the linear dependency computation, explains the LDC capabilities and its usefulness, and discusses the computational issues of the problem
  • Keywords
    built-in self test; design for testability; fault location; polynomials; LDC; built-in test; characteristic polynomial; computational issues; dependency polynomial; fault coverage; linear dependency check; residue combinations; sampling polynomial; testing space; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Ear; Linear feedback shift registers; Polynomials; Sampling methods; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1991., Proceedings of the 34th Midwest Symposium on
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    0-7803-0620-1
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1991.252037
  • Filename
    252037