DocumentCode
3399115
Title
Linear dependency check in built-in test
Author
Yang, Chyan
Author_Institution
Dept. of Electr. & Comput. Eng., US Naval Postgraduate Sch., Monterey, CA, USA
fYear
1991
fDate
14-17 May 1991
Firstpage
615
Abstract
Given a characteristic polynomial and a sampling polynomial with respect to it, whether the sampling polynomial is a dependency polynomial is important to the designer. A dependency polynomial gives low fault coverage in the built-in self test. The tool LDC (linear dependency check) computes the residue combinations of the factors in the set polynomial and advises designers if the sampling polynomial covers all the testing space. When the sampling polynomial is a dependency polynomial, LDC will try to find one, if any, independent polynomial at a minimum cost. In cases of short test vectors, LDC can exhaustively enumerate all independent polynomials for the designers to choose from. The author reviews the basics of the linear dependency computation, explains the LDC capabilities and its usefulness, and discusses the computational issues of the problem
Keywords
built-in self test; design for testability; fault location; polynomials; LDC; built-in test; characteristic polynomial; computational issues; dependency polynomial; fault coverage; linear dependency check; residue combinations; sampling polynomial; testing space; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Ear; Linear feedback shift registers; Polynomials; Sampling methods; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1991., Proceedings of the 34th Midwest Symposium on
Conference_Location
Monterey, CA
Print_ISBN
0-7803-0620-1
Type
conf
DOI
10.1109/MWSCAS.1991.252037
Filename
252037
Link To Document