DocumentCode :
3399116
Title :
Characterization of Error-Tolerant Applications when Protecting Control Data
Author :
Thaker, Darshan D. ; Franklin, Diana ; Oliver, John ; Biswas, Susmit ; Lockhart, Derek ; Metodi, Tzvetan ; Chong, Frederic T.
Author_Institution :
California Univ., Davis, CA
fYear :
2006
fDate :
25-27 Oct. 2006
Firstpage :
142
Lastpage :
149
Abstract :
Soft errors have become a significant concern and recent studies have measured the "architectural vulnerability factor" of systems to such errors, or conversely, the potential that a soft error is masked by latches or other system behavior. We take soft-error tolerance one step further and examine when an application can tolerate errors that are not masked. For example, a video decoder or approximation algorithm can tolerate errors if the user is willing to accept degraded output. The key observation is that while the decoder can tolerate error in its data, it can not tolerate error in its control. We first present static analysis that protects most control operations. We examine several SPEC CPU2000 and MiBench benchmarks for error tolerance, develop fidelity measures for each, and quantify the effect of errors on fidelity. We show that protecting control is crucial to producing error-tolerance, for without this protection, many applications experience catastrophic errors (infinite execution time or crashing). Overall, our results indicate that with simple control protection, the error tolerance of many applications can provide designers with considerable added flexibility when considering future challenges posed by soft errors
Keywords :
fault tolerant computing; program control structures; program diagnostics; architectural vulnerability factor; control data; control operation; control protection; soft-error tolerance; static analysis; system behavior; Circuit faults; Control systems; Costs; Decoding; Error correction; Image coding; Latches; Microarchitecture; Protection; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Workload Characterization, 2006 IEEE International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
1-4244-0508-4
Electronic_ISBN :
1-4244-0509-2
Type :
conf
DOI :
10.1109/IISWC.2006.302738
Filename :
4086142
Link To Document :
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