DocumentCode :
3399250
Title :
Feasibility of living monitoring EPR DC cable based on different DC current method
Author :
Xiaojun Shen ; Zhang, Yicheng ; Shi, Qingmei ; Wei Li
Author_Institution :
Dept. of Electr. Eng., Tongji Univ., Shanghai, China
fYear :
2009
fDate :
19-23 July 2009
Firstpage :
313
Lastpage :
316
Abstract :
In the paper, firstly, the insulation aging and insulation cut or crack fault models of DC feeder cable were established; then according to the characteristics of electrical and loads of DC feeder cable, the Rail- Voltage law and different DC current law were purposed in the orbital theory, and the feasibility of purposed law were discussed from engineering view. The results of analysis show that the Rail-Voltage law could not be carried out in real project, because there were lots of interferences and could not be separated; and the different DC current law meets the real projection request and could be carried out. Lastly, simulation tests were done to investigate the effectiveness of different DC current law to detect the cable faults in the Laboratory. The results of experiment show that the different DC current law had great limitations on detecting insulation cut or crack fault of DC feeder cable, and the effectiveness was impacted by the environment especially soil moisture. Another law should be found to living detect the insulation cut or crack fault of EPR DC cable.
Keywords :
ageing; cracks; fault location; fault simulation; insulation; power supplies to apparatus; railway electrification; DC current method; DC feeder cable; EPR DC cable; fault model; insulation aging; insulation crack; insulation cut; rail-voltage law; Aging; Cable insulation; Dielectrics and electrical insulation; Fault detection; Interference; Monitoring; Paramagnetic resonance; Railway engineering; Testing; Voltage; EPR cable; different DC current law; insulation aging; insulation crack; living monitoring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-4367-3
Electronic_ISBN :
978-1-4244-4368-0
Type :
conf
DOI :
10.1109/ICPADM.2009.5252422
Filename :
5252422
Link To Document :
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