DocumentCode :
3399654
Title :
Sequential sampling time domain reflectometer
Author :
Negrea, Catalin ; Rangu, Marius
Author_Institution :
Electron. & Telecommun. Fac., Politeh. Univ., Timisoara, Romania
fYear :
2009
fDate :
17-20 Sept. 2009
Firstpage :
367
Lastpage :
371
Abstract :
Time domain reflectometry (TDR) is a well-known technique used to detect and characterize impedance discontinuities in transmission lines. Usually the application of this technique employs the usage of a step generator to drive one end of the transmission line and a high speed oscilloscope to visualize the signal reflected at various impedance discontinuities points. This paper presents the design and implementation of an USB-based time domain reflectometer which integrates the functions of both equipments and is intended to be a low cost solution for time domain reflectometry. The acquisition technique used is sequential sampling based on integrated delay lines, giving a time step of 250 [ps] at a total acquisition time of about 2.6 [us]. Sequential sampling is successfully used for high speed sampling oscilloscopes and can be implemented using commercially available components. Unlike similar implementations of the method, our proposal uses internal delay calibration to eliminate the ghost effect which limits the minimum measurable cable length. Also, by comparison with random sampling TDRs, our approach allows an improved control over the acquisition parameters.
Keywords :
oscilloscopes; reflectometers; signal sampling; time-domain reflectometry; high speed oscilloscope; integrated delay lines; sequential sampling; step generator; time-domain reflectometer; time-domain reflectometry; Cost function; Drives; Impedance; Oscilloscopes; Reflectometry; Sampling methods; Signal generators; Transmission line discontinuities; Transmission lines; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Technology of Electronics Packages, (SIITME) 2009 15th International Symposium for
Conference_Location :
Gyula
Print_ISBN :
978-1-4244-5132-6
Electronic_ISBN :
978-1-4244-5133-3
Type :
conf
DOI :
10.1109/SIITME.2009.5407341
Filename :
5407341
Link To Document :
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