DocumentCode
3399937
Title
The characteristics of FRA results for different tap position on inter bus transformer (IBT) 166 MVA
Author
Siregar, Rikardo ; Muchtar, Ari
Author_Institution
PT. PLN Persero, Jakarta, Indonesia
fYear
2009
fDate
19-23 July 2009
Firstpage
265
Lastpage
267
Abstract
Nowadays, Sweep FRA becomes a common measurement tool used to identify the transformer condition. The standard for this technique and how to interpret the result has been released by CIGRE and IEEE. PT PLN P3BJB is operating 787 transformers from various voltage ratios. Most of the transformers are 150/20 kV (64.4%) and there are 35 transformers operated in 500/150 kV. Each of the transformers is provided with OLTC to adjust the output voltage. As a common knowledge, every transformer has its own RLC value. The RLC value will be influenced by some factors, i.e. natural aging, low voltage side disturbance or even tap position. If the tap position changing, the number of turn will be different, means RLC value will be different. Based on this condition, interpretation should be done carefully. In this paper we will describe the characteristic of SFRA measurement result for Inter Bus Transformer (IBT) 166 MVA operated in 500/150 kV. According to measurement results, by changing the tap position, the pattern of SFRA result for IBT 166 MVA will be different in frequency range 1 kHz-100 kHz, especially for full tap winding and without tap winding.
Keywords
frequency response; on load tap changers; transformer windings; FRA; SFRA measurement; apparent power 166 MVA; inter bus transformer; on-load tap changer; sweep frequency response analysis; transformer winding; voltage 150 kV; voltage 500 kV; Aging; Dielectric materials; Dielectric measurements; Frequency measurement; Hydrogen; Low voltage; Position measurement; RLC circuits; Short circuit currents; US Department of Transportation; Sweep FRA; tap position; tap winding; transformer;
fLanguage
English
Publisher
ieee
Conference_Titel
Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
Conference_Location
Harbin
Print_ISBN
978-1-4244-4367-3
Electronic_ISBN
978-1-4244-4368-0
Type
conf
DOI
10.1109/ICPADM.2009.5252455
Filename
5252455
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