• DocumentCode
    3400282
  • Title

    Stencil deformation during stencil printing

  • Author

    Krammer, Olivér ; Molnár, László-Milán ; Jakab, László ; Klein, Christian

  • Author_Institution
    Dept. of Electron. Technol., Budapest Univ. of Technol. & Econ., Budapest, Hungary
  • fYear
    2009
  • fDate
    17-20 Sept. 2009
  • Firstpage
    179
  • Lastpage
    184
  • Abstract
    Uneven solder mask thickness or other artifacts on PCBs can keep the stencil away from the PCB during stencil printing, which cause large deposited solder paste volume, and can result in solder bridges after reflow soldering. In our experiment we have investigated the deformation properties of stencils. The load-strain curve of a 125 ¿m thick stainless steel stencil was measured on nine locations. By the deformation experiments, the FEM (Finite Element Method) model of the stencil was created. With FEM simulations, the minimum technological distances (distance between artifacts and solder pads) for a range of step heights (difference between artifact height and pad height) and for different stencil thicknesses were determined. With the adherence to this technological distance, the stencil can bend down to the pad, and the proper amount of solder paste can be deposited onto the pad.
  • Keywords
    deformation; finite element analysis; masks; printed circuit manufacture; soldering; stainless steel; PCB; deformation properties; finite element method model; load-strain curve; reflow soldering; solder bridges; solder mask thickness; solder paste volume; stainless steel stencil; stencil deformation; stencil printing; stencil thickness; technological distance; Apertures; Assembly; Automotive electronics; Bridge circuits; Clocks; Electronics packaging; Printing; Reflow soldering; Semiconductor device modeling; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Technology of Electronics Packages, (SIITME) 2009 15th International Symposium for
  • Conference_Location
    Gyula
  • Print_ISBN
    978-1-4244-5132-6
  • Electronic_ISBN
    978-1-4244-5133-3
  • Type

    conf

  • DOI
    10.1109/SIITME.2009.5407378
  • Filename
    5407378