DocumentCode :
3400445
Title :
Analysis of wideband EM waves emitted from partial discharge using the constrained interpolation profile (CIP) method and the in-place fast haar wavelet transform
Author :
Kawada, Masatake ; Isaka, Katsuo
Author_Institution :
Inst. of Technol. & Sci., Univ. of Tokushima, Tokushima
fYear :
2008
fDate :
21-24 April 2008
Firstpage :
1
Lastpage :
6
Abstract :
Measurement of partial discharge (PD) has been used to assess the condition of insulation material used in electric power equipment. Analysis on the electromagnetic (EM) waves emitted from PD is useful from the viewpoint of noncontact diagnosis because PD emits wideband EM waves. The constrained interpolation profile method (CIP) is used to visualize the wideband EM waves emitted from PD for understanding the physical mechanism. The wideband EM waves are analyzed by using the in-place fast Haar wavelet transform(IP-FHWT), which can show the discrete time- frequency components. The PD is numerically obtained by the total amount of charge and the rise time. Numerical results show that the proposed method based on the CIP and the IP-FHWT is useful for analyzing the relationship between the PD current and the EM waves.
Keywords :
Haar transforms; electromagnetic waves; insulating materials; interpolation; partial discharges; power apparatus; wavelet transforms; constrained interpolation profile method; electric power equipment; electromagnetic waves; in-place fast Haar Wavelet transform; insulation material; partial discharge; wideband EM waves; Dielectrics and electrical insulation; Electric variables measurement; Electromagnetic measurements; Interpolation; Partial discharge measurement; Partial discharges; Power measurement; Wavelet analysis; Wavelet transforms; Wideband; Constrained interpolation profile (CIP) method; Electromagnetic (EM) waves; Partial discharge (PD); the in-place fast Haar wavelet transform (IP-FHWT);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transmission and Distribution Conference and Exposition, 2008. T&D. IEEE/PES
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-1903-6
Electronic_ISBN :
978-1-4244-1904-3
Type :
conf
DOI :
10.1109/TDC.2008.4517292
Filename :
4517292
Link To Document :
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