DocumentCode
3400469
Title
Correlation between the thermophysical properties, geometry and microstructure of the SAC305 and SAC-X typical solder joints
Author
Branzei, M. ; Svasta, P. ; Miculescu, F. ; Miculescu, M. ; Plotog, I.
Author_Institution
Dept. of Mater. Sci. & Phys. Metall., Politeh. Univ., Bucharest, Romania
fYear
2009
fDate
17-20 Sept. 2009
Firstpage
129
Lastpage
133
Abstract
The quality and reliability of microelectronics components and assemblies can be considered as expression of solder joints functionality. The functionality of the lead free-solder joints is in strong connection with the microstructure, which is the result of the temperature gradient action over the trinomial solder alloy/paste, electronic components terminals and PCBs pads finishes, the gradient being determined by the specific thermal profile of the soldering process. These properties are in close connection with the microstructure of the solder joints, which are the result of the ¿4-P Soldering Model¿ (Paste-Pad-Pin-Process), with a special focus on lead-free solder alloys, and by different thermal profiles of the used soldering processes. The experiments presented in the paper describe measurements of the termophysical properties, the macro and micro-structural analysis on surface, in volume and at the interface of solder joints with the metallic substrate effectuated in order to identify the typical solder joints microstructures, over solder joints functionality.
Keywords
geometry; integrated circuits; soldering; substrates; 4P soldering model; SAC-X typical solder joints; SAC305 solder joints; assemblies; electronic components terminals; geometry; lead free-solder joints; lead-free solder alloys; macrostructural analysis; metallic substrate; microelectronics components; microstructural analysis; solder joints functionality; solder joints microstructures; soldering process; thermal profiles; thermophysical properties; trinomial solder alloy; Assembly; Electronic components; Environmentally friendly manufacturing techniques; Geometry; Lead; Microelectronics; Microstructure; Soldering; Temperature; Volume measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Technology of Electronics Packages, (SIITME) 2009 15th International Symposium for
Conference_Location
Gyula
Print_ISBN
978-1-4244-5132-6
Electronic_ISBN
978-1-4244-5133-3
Type
conf
DOI
10.1109/SIITME.2009.5407386
Filename
5407386
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