• DocumentCode
    3400522
  • Title

    IBM´s 50 million gate ASICs

  • Author

    Koehl, Juergen ; Lackey, David E. ; Doerre, George

  • Author_Institution
    IBM Microeletronics, Essex Junction, VT, USA
  • fYear
    2003
  • fDate
    21-24 Jan. 2003
  • Firstpage
    628
  • Lastpage
    634
  • Abstract
    There is no slowdown in the complexity increase for ASIC and SoC designs. As we write this paper in August, 2002, 40 M gate ASICs are nearing tape-out, and 50 M gate designs are likely to start before this conference takes place. This paper describes the current tool and methodology development efforts focused on enabling ASIC and SoC designs of these sizes and complexity, centered around the reduction of design turn-around-time, improvement of the quality of results and the modeling and optimization of deep sub-micron electrical effects.
  • Keywords
    application specific integrated circuits; circuit optimisation; integrated circuit design; integrated circuit modelling; logic design; system-on-chip; ASIC complexity; SoC design; chip gate count; chip size; circuit modeling; circuit reuse; design methodologies; design tools; design turn-around-time reduction; optimization; quality improvement; sub-micron electrical effects; Algorithm design and analysis; Amplitude shift keying; Application specific integrated circuits; Chip scale packaging; Design optimization; Hardware; Logic; Microelectronics; Rivers; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2003. Proceedings of the ASP-DAC 2003. Asia and South Pacific
  • Print_ISBN
    0-7803-7659-5
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2003.1195100
  • Filename
    1195100