Title :
A novel LCD driver testing technique using logic test channels
Author :
Su, Chauchin ; Wang, Wei-Juo ; Wang, Chih-Hu ; Tseng, I.S.
Author_Institution :
Dept. of Electr. & Control Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
This paper proposes a novel voltage measurement technique for LCD driver testing by the use of the logic test channel of an ATE. The method is able to achieve less than 1 mV error with the presence of 32 mV RMS noise.
Keywords :
automatic test equipment; driver circuits; error analysis; integrated circuit noise; integrated circuit testing; liquid crystal displays; logic testing; measurement errors; voltage measurement; 32 mV; ATE; LCD driver testing technique; RMS noise; logic test channels; measurement error; voltage measurement technique; Cellular phones; Centralized control; Circuit testing; Computer errors; Driver circuits; Liquid crystal displays; Logic testing; Phasor measurement units; Portable computers; Voltage measurement;
Conference_Titel :
Design Automation Conference, 2003. Proceedings of the ASP-DAC 2003. Asia and South Pacific
Print_ISBN :
0-7803-7659-5
DOI :
10.1109/ASPDAC.2003.1195104
