Title :
Microwave methods of ferroelectrics and related materials investigation
Author :
Poplavko, Y. ; Molchanov, V. ; Pashkov, V. ; Kazmirenko, V.
Author_Institution :
Nat. Tech. Univ. of Ukraine, Kiev
Abstract :
Ferroelectric materialspsila distinct feature is large dielectric permittivity epsiv which sometimes is accompanied by the large loss tangent tandelta. Often this becomes an obstacle to conduct their accurate characterization despite of variety of techniques available. This report is devoted to the selection of proper method for specific cases of bulk or film materials investigation to obtain reliable data of their epsiv and tandelta.
Keywords :
dielectric losses; ferroelectric materials; ferroelectric thin films; microwave measurement; permittivity; bulk materials; dielectric permittivity; ferroelectrics; film materials; loss tangent; microwave methods; Capacitors; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Dielectric substrates; Ferroelectric films; Ferroelectric materials; Microwave measurements; Microwave theory and techniques;
Conference_Titel :
Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
978-966-335-166-7
Electronic_ISBN :
978-966-335-169-8
DOI :
10.1109/CRMICO.2008.4676493
