DocumentCode :
3401363
Title :
RF-power amplifier characteristics determination using parallel cascade Wiener models and pseudo-inverse techniques
Author :
Silveira, D. ; Gadringer, M. ; Arthaber, H. ; Magerl, G.
Author_Institution :
Inst. of Electr. Meas. & Circuit Design, Vienna Univ. of Technol., Austria
Volume :
1
fYear :
2005
fDate :
4-7 Dec. 2005
Abstract :
This article presents a black-box modeling approach of a microwave power amplifier (PA) and defines the linear and nonlinear operation regions. An in-band quasi-white real-valued noise like signal is used as stimulus for the identification process to excite every possibly source of nonlinearity. A segment of the input-output measurement data is processed to generate an initial parallel cascade Wiener model (PCWM). The first order Volterra kernel is extracted in order to estimate the amplifier´s memory. Then pseudo-inverse techniques are used to find a parsimonious model. This model is cross-validated with the entire measurement data. The presented modeling approach results in a model intended to be numerically robust and having a high identification percentage based on a variance figure of merit. Finally the linear and nonlinear operation regions of the amplifier are defined, as an alternative to the use of AM/AM curves.
Keywords :
Volterra series; microwave power amplifiers; RF-power amplifier characteristics determination; amplifier memory; black-box modeling approach; first order Volterra kernel; linear operation regions; microwave power amplifier; nonlinear operation regions; parallel cascade Wiener models; pseudo-inverse techniques; Chebyshev approximation; Data mining; Kernel; Microwave amplifiers; Microwave measurements; Operational amplifiers; Polynomials; Power amplifiers; Power measurement; Sampling methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference Proceedings, 2005. APMC 2005. Asia-Pacific Conference Proceedings
Print_ISBN :
0-7803-9433-X
Type :
conf
DOI :
10.1109/APMC.2005.1606224
Filename :
1606224
Link To Document :
بازگشت