• DocumentCode
    3401403
  • Title

    Throughput time forecasting model

  • Author

    Raddon, Aaron ; Grigsby, Barry

  • Author_Institution
    Intel Corp., Rio Rancho, NM, USA
  • fYear
    1997
  • fDate
    10-12 Sep 1997
  • Firstpage
    430
  • Lastpage
    433
  • Abstract
    Market conditions continually force the need to increase operational performance through increased equipment utilization and productivity. Fab 7 ramped a perceived full Fab by an additional 25% in order to meet a growing Flash market. The additional load on the factory incurred an unanticipated increase in Fab Throughput Time (TPT). It was obvious that a change in forecasting methodology was required. A model to forecast the TPT based on the Long Range Plan (LRP) was developed. The TPT model has increased Fab 7´s ability to more accurately predict die-out commitments. Moreover, the model increased predictability of TPT (+/-2 days) from 50% to 100%. Finally, the model has provided a business tool to evaluate factory parameter trade-offs
  • Keywords
    forecasting theory; integrated circuit manufacture; Fab 7 factory; business tool; equipment utilization; flash memory manufacture; forecasting model; long range plan; predictability; productivity; semiconductor fab; throughput time; Continuous improvement; Costs; Data analysis; Demand forecasting; Economic forecasting; Manufacturing; Predictive models; Production facilities; Productivity; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 1997. IEEE/SEMI
  • Conference_Location
    Cambridge, MA
  • ISSN
    1078-8743
  • Print_ISBN
    0-7803-4050-7
  • Type

    conf

  • DOI
    10.1109/ASMC.1997.630775
  • Filename
    630775