• DocumentCode
    3401691
  • Title

    Transient behavior of ATM networks under overloads

  • Author

    Wang, Chang-Yu ; Logothetis, Dimitris ; Trivedi, Kishor S. ; Viniotis, Ioannis

  • Author_Institution
    Dept. of Comput. Sci., Duke Univ., Durham, NC, USA
  • Volume
    3
  • fYear
    1996
  • fDate
    24-28 Mar 1996
  • Firstpage
    978
  • Abstract
    We characterize the time-dependent behavior of a typical queuing system that arise in ATM networks under the presence of overloads. The transient queue length distribution and transient cell loss probability are obtained numerically and transient characteristics such as maximum overshoot and relaxation time are used to quantify the effects of congestion periods. A new measure, expected excess loss in overload (EELO) is defined to quantify the effects of overload when compared with the system behavior in the steady-state regime. The basic modeling technology that we use is an extended form of stochastic Petri nets and a software tool called the stochastic Petri net package (SPNP)
  • Keywords
    Petri nets; asynchronous transfer mode; probability; queueing theory; software packages; software tools; stochastic processes; telecommunication computing; telecommunication congestion control; telecommunication networks; transient analysis; ATM networks; congestion periods; excess loss in overload; maximum overshoot; modeling technology; overloads; queuing system; relaxation time; software tool; steady-state regime; stochastic Petri net package; stochastic Petri nets; time-dependent behavior; transient behavior; transient cell loss probability; transient characteristics; transient queue length distribution; Computer networks; Explosions; Length measurement; Loss measurement; Particle measurements; Petri nets; Queueing analysis; Size measurement; Stochastic processes; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    INFOCOM '96. Fifteenth Annual Joint Conference of the IEEE Computer Societies. Networking the Next Generation. Proceedings IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0743-166X
  • Print_ISBN
    0-8186-7293-5
  • Type

    conf

  • DOI
    10.1109/INFCOM.1996.493039
  • Filename
    493039