DocumentCode :
3402000
Title :
Shot Noise Models for Outage and Throughput Analyses in Wireless Ad Hoc Networks
Author :
Venkataraman, Jagadish ; Haenggi, Martin ; Collins, Oliver
Author_Institution :
Dept. of Electr. Eng., Notre Dame Univ., IN
fYear :
2006
fDate :
23-25 Oct. 2006
Firstpage :
1
Lastpage :
7
Abstract :
Shot noise processes with a decaying power law impulse response function are ideally suited for modeling the network self-interference in an ad hoc network where the nodes are distributed in a plane according to a Poisson point process. A stochastic impulse response function can be used to model different random parameters like channel fluctuation, variable transmission power of the nodes etc. However, for a decaying power law, all the moments of the interference diverge. In this paper, we extend the 2D shot noise model to represent a modified power law that is not only more realistic but also allows for finite moments for the interference. For this model, we present performance curves for the AWGN channel with and without variable transmission power at the nodes as well as for the fading channel. Then, we impose a guard zone around each receiver node in the network, modify the shot noise model to this channel access scheme and demonstrate the improvement in per-node throughput that a guard zone is capable of providing
Keywords :
AWGN channels; ad hoc networks; fading channels; radiofrequency interference; shot noise; stochastic processes; transient response; AWGN channel; Poisson point process; channel access scheme; channel fluctuation; decaying power law; fading channel; finite moment; guard zone; network self-interference; shot noise model; stochastic impulse response function; variable transmission power; wireless ad hoc network; AWGN channels; Ad hoc networks; Additive white noise; Fading; Fluctuations; Gaussian noise; Interference; Mobile ad hoc networks; Stochastic resonance; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Military Communications Conference, 2006. MILCOM 2006. IEEE
Conference_Location :
Washington, DC
Print_ISBN :
1-4244-0617-X
Electronic_ISBN :
1-4244-0618-8
Type :
conf
DOI :
10.1109/MILCOM.2006.302418
Filename :
4086349
Link To Document :
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