Title :
The DIRC front-end electronics chain for BaBar
Author :
Bailly, P. ; Beigbeder, C. ; Bernier, R. ; Breton, D. ; Bonneaud, G. ; Caceres, T. ; Chase, R. ; Chauveau, J. ; Del Buono, L. ; Dohou, F. ; Ducorps, A. ; Gastaldi, F. ; Genat, J.F. ; Hrisoho, A. ; Imbert, P. ; Lebbolo, H. ; Matricon, P. ; Oxoby, G. ; Rena
Author_Institution :
Lab. de Phys. Nucl. et de Hautes Energies, Paris VI/VII Univ., France
Abstract :
Recent results from the front-end electronics of the Detector of Internally Reflected Cerenkov light (DIRC) for the BaBar experiment at SLAC (Stanford, USA) are presented. It measures to better than 1 ns the arrival time of Cerenkov photoelectrons, detected in a 11,000 phototubes array and their amplitude spectra. It mainly comprises 64-channel DIRC front-end boards (DFB) equipped with eight full-custom analog chips performing zero-cross discrimination with 2 mV threshold and pulse shaping, four full-custom digital TDC chips for timing measurements with 500 ps binning and a readout logic selecting hits in the trigger window, and DIRC crate controller cards (DCC) serializing the data collected from up to 16 DFBs onto a 1.2 Gb/s optical link. Extensive test results of the pre-production chips are presented, as well as system tests
Keywords :
Cherenkov counters; analogue processing circuits; analogue-digital conversion; application specific integrated circuits; nuclear electronics; pulse shaping; readout electronics; BaBar; Cerenkov photoelectrons; DIRC crate controller cards; DIRC front-end boards; DIRC front-end electronics chain; Detector of Internally Reflected Cerenkov light; full-custom analog chips; full-custom digital TDC chips; pre-production chips; pulse shaping; readout logic; timing measurements; zero-cross discrimination; Logic; Performance evaluation; Photoelectricity; Pulse measurements; Pulse shaping methods; Semiconductor device measurement; Shape control; System testing; Time measurement; Timing;
Conference_Titel :
Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
Conference_Location :
Toronto, Ont.
Print_ISBN :
0-7803-5021-9
DOI :
10.1109/NSSMIC.1998.774320
