DocumentCode
340223
Title
Characterization of a multiplexed Compton scatter tomograph for non-destructive inspection of thin, low-Z samples
Author
Evans, B.L. ; Martin, J.B. ; Burggraf, L.W.
Author_Institution
Inst. of Technol., Wright-Patterson AFB, OH, USA
Volume
2
fYear
1998
fDate
1998
Firstpage
1000
Abstract
A demonstration multiplexed Compton scatter tomograph (MCST) has been built to assess the feasibility of performing single-sided, nondestructive inspection of thin, low-Z structures such as aluminum aircraft skin
Keywords
Compton effect; X-ray imaging; inspection; nondestructive testing; tomography; Al; aircraft skin; multiplexed Compton scatter tomograph; nondestructive inspection; single-sided inspection; thin low-Z samples; Aircraft; Aluminum; Corrosion; Electromagnetic scattering; Gamma ray detection; Gamma ray detectors; Image reconstruction; Inspection; Particle scattering; Skin;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
Conference_Location
Toronto, Ont.
ISSN
1082-3654
Print_ISBN
0-7803-5021-9
Type
conf
DOI
10.1109/NSSMIC.1998.774335
Filename
774335
Link To Document