Title :
Metrological characteristics of the frequency meter scale using the method of coincidence
Author :
Trotsishin, I.V. ; Voytyuk, O.P. ; Trotsishina, I.V.
Author_Institution :
Khmel´nitskiy Nat. Univ., Khmelnitsskiy
Abstract :
Presented in this paper are experimental results regarding frequency measurement using the method of coincidence. It is possible to simultaneously increase measurement accuracy and speed. Provided the increasing of the codeword length, the frequency scale is getting linear and saturated.
Keywords :
frequency measurement; frequency meters; frequency measurement; frequency meter scale; method of coincidence; metrological characteristics; Flowcharts; Frequency; Helium; IEEE catalog; Microwave technology; Organizing;
Conference_Titel :
Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
978-966-335-166-7
Electronic_ISBN :
978-966-335-169-8
DOI :
10.1109/CRMICO.2008.4676556
