Title :
Resonator Q-factor measurement under conditions of mode degeneration removal
Author :
Glamazdin, V.V. ; Skresanov, V.N.
Author_Institution :
Usikov Inst. of Radio Phys. & Electron., Nat. Acad. of Sci. of Ukraine, Kharkiv
Abstract :
A simple approach that allows determining the loaded quality factor of microwave resonators under conditions of the resonance line splitting corresponding to two-fold degenerative mode has been proposed. This technique, for example, solves the problem of superconductor surface resistance measurements using sapphire two-fold degenerative whispering gallery mode resonators.
Keywords :
Q-factor; microwave devices; resonators; whispering gallery modes; microwave resonators; quality factor; resonance line splitting; sapphire two-fold degenerative whispering gallery mode resonators; superconductor surface resistance; Positron emission tomography; Q factor;
Conference_Titel :
Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
978-966-335-166-7
Electronic_ISBN :
978-966-335-169-8
DOI :
10.1109/CRMICO.2008.4676558
