DocumentCode :
340234
Title :
High resolution X-ray imaging using amorphous silicon flat-panel arrays
Author :
Rahn, J.T. ; Lemmi, F. ; Lu, J.P. ; Mei, P. ; Apte, R.B. ; Street, R.A. ; Lujan, R. ; Weisfield, R.L. ; Heanue, J.A.
Author_Institution :
Xerox Palo Alto Res. Center, CA, USA
Volume :
2
fYear :
1998
fDate :
1998
Firstpage :
1073
Abstract :
Two dimensional amorphous silicon arrays are the emerging technology for digital medical X-ray imaging. This paper demonstrates an improved pixel design compared with the current generation of imagers. The geometry of the pixel sensor has been extended from a mesa isolated structure into a continuous layer above the readout structures of the array. This approach improves sensitivity to visible light and X-ray illumination when coupled with a conversion phosphor. Furthermore, this 3-dimensional geometry allows for the fabrication of the finest pitch amorphous silicon array yet manufactured, with a pixel size of 64 μm square. A test array (512×640 pixels) has been fabricated and tested which demonstrates the success of this approach
Keywords :
amorphous semiconductors; diagnostic radiography; silicon radiation detectors; Si; amorphous silicon flat-panel arrays; conversion phosphor; digital medical X-ray imaging; high resolution X-ray imaging; mesa isolated structure; pixel design; pixel sensor; readout structures; Amorphous silicon; Biomedical imaging; Geometry; Image generation; Image resolution; Isolation technology; Pixel; Sensor arrays; Testing; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
Conference_Location :
Toronto, Ont.
ISSN :
1082-3654
Print_ISBN :
0-7803-5021-9
Type :
conf
DOI :
10.1109/NSSMIC.1998.774350
Filename :
774350
Link To Document :
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