Title :
Computer microwave diagnostic system for measurement of parameters of sandwich-like micro- and nano-structures
Author :
Usanov, D.A. ; Skripal, A.V. ; Abramov, A.V. ; Bogolubov, A.S.
Author_Institution :
Saratov State Univ., Saratov
Abstract :
The Computer Diagnostic System for measurement of parameters of sandwich-like metal-dielectric and metal-semiconductor micro- and nano-structures from the reflection and transmission microwave spectra, developed in Saratov State University, is presented.
Keywords :
computerised instrumentation; metal-insulator boundaries; microwave measurement; microwave spectra; nanostructured materials; physics computing; semiconductor-metal boundaries; computer microwave diagnostic system; metal-dielectric structure; metal-semiconductor structure; microwave spectra; sandwich-like microstructure; sandwich-like nanostructure; Detectors; Directional couplers; Helium; IEEE catalog; Microwave measurements; Microwave oscillators; Microwave technology; Nanostructures; Organizing; Software measurement;
Conference_Titel :
Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
978-966-335-166-7
Electronic_ISBN :
978-966-335-169-8
DOI :
10.1109/CRMICO.2008.4676559
