DocumentCode
3402364
Title
Computer microwave diagnostic system for measurement of parameters of sandwich-like micro- and nano-structures
Author
Usanov, D.A. ; Skripal, A.V. ; Abramov, A.V. ; Bogolubov, A.S.
Author_Institution
Saratov State Univ., Saratov
fYear
2008
fDate
8-12 Sept. 2008
Firstpage
692
Lastpage
693
Abstract
The Computer Diagnostic System for measurement of parameters of sandwich-like metal-dielectric and metal-semiconductor micro- and nano-structures from the reflection and transmission microwave spectra, developed in Saratov State University, is presented.
Keywords
computerised instrumentation; metal-insulator boundaries; microwave measurement; microwave spectra; nanostructured materials; physics computing; semiconductor-metal boundaries; computer microwave diagnostic system; metal-dielectric structure; metal-semiconductor structure; microwave spectra; sandwich-like microstructure; sandwich-like nanostructure; Detectors; Directional couplers; Helium; IEEE catalog; Microwave measurements; Microwave oscillators; Microwave technology; Nanostructures; Organizing; Software measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
Conference_Location
Sevastopol, Crimea
Print_ISBN
978-966-335-166-7
Electronic_ISBN
978-966-335-169-8
Type
conf
DOI
10.1109/CRMICO.2008.4676559
Filename
4676559
Link To Document