Title :
Technology-friendly phase-locked loops
Author :
Ni Xu ; Zhuo Zhang ; Yuanfeng Sun ; Woogeun Rhee ; Zhihua Wang
Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing, China
Abstract :
This paper presents recent architectures of the phase-locked loop (PLL) systems which relax technology dependency and provide robust, low-cost frequency generation. The first part of the paper discusses architecture advantages of the dual-path PLL which significantly reduces loop bandwidth variation. The second part of the paper reviews recent hybrid PLL architectures which do not employ the time-to-digital converter (TDC) but still offer technology scalability and leakage current immunity.
Keywords :
convertors; leakage currents; phase locked loops; dual-path PLL; hybrid PLL architectures; leakage current immunity; loop bandwidth variation; low-cost frequency generation; phase-locked loop systems; technology scalability; technology-friendly phase-locked loops; time-to-digital converter; Complexity theory;
Conference_Titel :
Circuits and Systems (MWSCAS), 2011 IEEE 54th International Midwest Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-61284-856-3
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2011.6026307