DocumentCode :
3402604
Title :
A framework for ultra high resolution 3D imaging
Author :
Lu, Zheng ; Tai, Yu-Wing ; Ben-Ezra, Moshe ; Brown, Michael S.
Author_Institution :
Nat. Univ. of Singapore, Singapore, Singapore
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
1205
Lastpage :
1212
Abstract :
We present an imaging framework to acquire 3D surface scans at ultra high-resolutions (exceeding 600 samples per mm2). Our approach couples a standard structured-light setup and photometric stereo using a large-format ultra-high-resolution camera. While previous approaches have employed similar hybrid imaging systems to fuse positional data with surface normals, what is unique to our approach is the significant asymmetry in the resolution between the low-resolution geometry and the ultra-high-resolution surface normals. To deal with these resolution differences, we propose a multi-resolution surface reconstruction scheme that propagates the low-resolution geometric constraints through the different frequency bands while gradually fusing in the high-resolution photometric stereo data. In addition, to deal with the ultra-high-resolution images, our surface reconstruction is performed in a patch-wise fashion and additional boundary constraints are used to ensure patch coherence. Based on this multi-resolution reconstruction scheme, our imaging framework can produce 3D scans that show exceptionally detailed 3D surfaces far exceeding existing technologies.
Keywords :
image reconstruction; image resolution; stereo image processing; 3D surface scans; high-resolution photometric stereo data; low-resolution geometric constraints; multi-resolution surface reconstruction scheme; photometric stereo; standard structured-light setup; ultra high resolution 3D imaging; Cameras; Frequency; Fuses; Geometry; High-resolution imaging; Image reconstruction; Image resolution; Photometry; Stereo image processing; Surface reconstruction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
Conference_Location :
San Francisco, CA
ISSN :
1063-6919
Print_ISBN :
978-1-4244-6984-0
Type :
conf
DOI :
10.1109/CVPR.2010.5539829
Filename :
5539829
Link To Document :
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