DocumentCode
3402770
Title
Minimum detectable capacitance in capacitive readout circuits
Author
Seraji, N.E. ; Yavari, Mohammad
Author_Institution
Dept. of Electr. Eng., Amirkabir Univ. of Technol., Tehran, Iran
fYear
2011
fDate
7-10 Aug. 2011
Firstpage
1
Lastpage
4
Abstract
In this paper, accurate equations are presented to calculate the capacitance resolution in the readout circuits exploiting different techniques to reduce the circuit low-frequency noise. The circuit parameters and trade-offs affecting the capacitance resolution are comprehensively involved in these equations. Transistor level simulations are performed with a 0.18 μm CMOS technology using Spectre RF to verify the obtained equations. The results of comparing two utilized common techniques, so called correlated double sampling (CDS) and chopper stabilization (CHS), reveal that employing the combination of these techniques results in the minimum resolution variation as the input parasitic capacitance is changed.
Keywords
CMOS integrated circuits; capacitive sensors; choppers (circuits); readout electronics; transistors; CDS; CHS; CMOS technology; capacitance detector; chopper stabilization; circuit low-frequency noise; correlated double sampling; parasitic capacitance; size 0.18 mum; spectre RF; transistor level simulations; Capacitance; Integrated circuits; Noise; Radio frequency; Simulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (MWSCAS), 2011 IEEE 54th International Midwest Symposium on
Conference_Location
Seoul
ISSN
1548-3746
Print_ISBN
978-1-61284-856-3
Electronic_ISBN
1548-3746
Type
conf
DOI
10.1109/MWSCAS.2011.6026322
Filename
6026322
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