• DocumentCode
    3402770
  • Title

    Minimum detectable capacitance in capacitive readout circuits

  • Author

    Seraji, N.E. ; Yavari, Mohammad

  • Author_Institution
    Dept. of Electr. Eng., Amirkabir Univ. of Technol., Tehran, Iran
  • fYear
    2011
  • fDate
    7-10 Aug. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, accurate equations are presented to calculate the capacitance resolution in the readout circuits exploiting different techniques to reduce the circuit low-frequency noise. The circuit parameters and trade-offs affecting the capacitance resolution are comprehensively involved in these equations. Transistor level simulations are performed with a 0.18 μm CMOS technology using Spectre RF to verify the obtained equations. The results of comparing two utilized common techniques, so called correlated double sampling (CDS) and chopper stabilization (CHS), reveal that employing the combination of these techniques results in the minimum resolution variation as the input parasitic capacitance is changed.
  • Keywords
    CMOS integrated circuits; capacitive sensors; choppers (circuits); readout electronics; transistors; CDS; CHS; CMOS technology; capacitance detector; chopper stabilization; circuit low-frequency noise; correlated double sampling; parasitic capacitance; size 0.18 mum; spectre RF; transistor level simulations; Capacitance; Integrated circuits; Noise; Radio frequency; Simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2011 IEEE 54th International Midwest Symposium on
  • Conference_Location
    Seoul
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-61284-856-3
  • Electronic_ISBN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2011.6026322
  • Filename
    6026322