Title :
Object recognition as ranking holistic figure-ground hypotheses
Author :
Li, Fuxin ; Carreira, Joao ; Sminchisescu, Cristian
Author_Institution :
Comput. Vision & Machine Learning Group, Univ. of Bonn, Bonn, Germany
Abstract :
We present an approach to visual object-class recognition and segmentation based on a pipeline that combines multiple, holistic figure-ground hypotheses generated in a bottom-up, object independent process. Decisions are performed based on continuous estimates of the spatial overlap between image segment hypotheses and each putative class. We differ from existing approaches not only in our seemingly unreasonable assumption that good object-level segments can be obtained in a feed-forward fashion, but also in framing recognition as a regression problem. Instead of focusing on a one-vs-all winning margin that can scramble ordering inside the non-maximum (non-winning) set, learning produces a globally consistent ranking with close ties to segment quality, hence to the extent entire object or part hypotheses spatially overlap with the ground truth. We demonstrate results beyond the current state of the art for image classification, object detection and semantic segmentation, in a number of challenging datasets including Caltech-101, ETHZ-Shape and PASCAL VOC 2009.
Keywords :
image classification; image segmentation; object recognition; Caltech-101; ETHZ-Shape; PASCAL VOC 2009; feed-forward fashion; framing recognition; globally consistent ranking; image classification; image segment hypotheses; image segmentation; nonmaximum set; nonwinning set; object detection; object independent process; object recognition; one-vs-all winning margin; ranking holistic figure-ground hypotheses; regression problem; semantic segmentation; spatial overlap; visual object-class recognition; Computer vision; Image segmentation; Machine learning; Mathematics; Numerical simulation; Object detection; Object recognition; Pipelines; Shape; Space exploration;
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-6984-0
DOI :
10.1109/CVPR.2010.5539839