• DocumentCode
    3402821
  • Title

    Measurement of UHF-permittivity of liquid crystals in porous silicon

  • Author

    Drokin, N.A. ; Timashov, V.A. ; Uzova, V.A.

  • Author_Institution
    L.V. Kirensky Inst. of Phys., Krasnoyarsk
  • fYear
    2008
  • fDate
    8-12 Sept. 2008
  • Firstpage
    745
  • Lastpage
    746
  • Abstract
    Method of dielectric investigation of liquid crystals (LQ) confined into porous silicon (PSi) is described. Individuality technique for dielectric measurements consists oa using two type sensors, switching as a system elements in the microstrip resonance contour. The effective permittivity and molecular alignments of PSi with LQ (8CB) is determined in frequency range 103 - 5 times 108 MHz.
  • Keywords
    elemental semiconductors; liquid crystals; microwave materials; molecular orientation; permittivity; porosity; porous materials; silicon; Si; UHF-permittivity; dielectric measurements; frequency 10000 MHz to 500000000 MHz; liquid crystals; microstrip resonance contour; molecular alignments; porous silicon; sensors; Flowcharts; Hafnium; Liquid crystals; Microstrip; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
  • Conference_Location
    Sevastopol, Crimea
  • Print_ISBN
    978-966-335-166-7
  • Electronic_ISBN
    978-966-335-169-8
  • Type

    conf

  • DOI
    10.1109/CRMICO.2008.4676583
  • Filename
    4676583