DocumentCode
3402821
Title
Measurement of UHF-permittivity of liquid crystals in porous silicon
Author
Drokin, N.A. ; Timashov, V.A. ; Uzova, V.A.
Author_Institution
L.V. Kirensky Inst. of Phys., Krasnoyarsk
fYear
2008
fDate
8-12 Sept. 2008
Firstpage
745
Lastpage
746
Abstract
Method of dielectric investigation of liquid crystals (LQ) confined into porous silicon (PSi) is described. Individuality technique for dielectric measurements consists oa using two type sensors, switching as a system elements in the microstrip resonance contour. The effective permittivity and molecular alignments of PSi with LQ (8CB) is determined in frequency range 103 - 5 times 108 MHz.
Keywords
elemental semiconductors; liquid crystals; microwave materials; molecular orientation; permittivity; porosity; porous materials; silicon; Si; UHF-permittivity; dielectric measurements; frequency 10000 MHz to 500000000 MHz; liquid crystals; microstrip resonance contour; molecular alignments; porous silicon; sensors; Flowcharts; Hafnium; Liquid crystals; Microstrip; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
Conference_Location
Sevastopol, Crimea
Print_ISBN
978-966-335-166-7
Electronic_ISBN
978-966-335-169-8
Type
conf
DOI
10.1109/CRMICO.2008.4676583
Filename
4676583
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