Title :
The method of measurements and dielectric parameters of the film materials at MM-wave range
Author :
Parshin, V.V. ; Serov, E.A.
Author_Institution :
Inst. of Appl. Phys., Russian Acad. of Sci., Nizhny Novgorod
Abstract :
For the MM and SubMM ranges, on the base of high-Q Fabry-Perot resonator the original method of dielectric parameters measurements of thin film materials (<lambda/2) which does not need the information about film thickness, is presented. The dielectric parameters of popular film materials like Teflon (PTFE), lavsan, Polyethylenterephthalat (PTFE) are presented. The essential difference of dielectric parameters of film and ldquobulkrdquo Teflon was found.
Keywords :
Fabry-Perot resonators; dielectric measurement; millimetre wave materials; polymer films; PET; PTFE; Teflon; dielectric parameters; high-Q Fabry-Perot resonator; lavsan; millimeter-wave materials; polyethylene terephthalate; thin films; Dielectric materials; Dielectric measurements; Helium; Tellurium;
Conference_Titel :
Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
978-966-335-166-7
Electronic_ISBN :
978-966-335-169-8
DOI :
10.1109/CRMICO.2008.4676587
