DocumentCode :
3402895
Title :
The lapse analysis of waveguide meter of electromagnetic materials parameters
Author :
Salamatin, V.V. ; Lemeshko, G.V.
Author_Institution :
Sevastopol Nat. Tech. Univ., Sevastopol
fYear :
2008
fDate :
8-12 Sept. 2008
Firstpage :
757
Lastpage :
758
Abstract :
The results of analysis of waveguide meter of electromagnetic materials parameters based of short circuit waveguide are presented. Measurement conditions effect on definition accuracy of parameters of investigated material is observed.
Keywords :
electromagnetic wave reflection; electromagnetism; permittivity measurement; waveguide theory; dielectric coefficient; electromagnetic materials; lapse analysis; reflection coefficient; short circuit waveguide; waveguide meter; Artificial intelligence; Bismuth; Electromagnetic analysis; Electromagnetic scattering; Electromagnetic waveguides; IEEE catalog; Microwave technology; Organizing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
978-966-335-166-7
Electronic_ISBN :
978-966-335-169-8
Type :
conf
DOI :
10.1109/CRMICO.2008.4676589
Filename :
4676589
Link To Document :
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