DocumentCode
3402895
Title
The lapse analysis of waveguide meter of electromagnetic materials parameters
Author
Salamatin, V.V. ; Lemeshko, G.V.
Author_Institution
Sevastopol Nat. Tech. Univ., Sevastopol
fYear
2008
fDate
8-12 Sept. 2008
Firstpage
757
Lastpage
758
Abstract
The results of analysis of waveguide meter of electromagnetic materials parameters based of short circuit waveguide are presented. Measurement conditions effect on definition accuracy of parameters of investigated material is observed.
Keywords
electromagnetic wave reflection; electromagnetism; permittivity measurement; waveguide theory; dielectric coefficient; electromagnetic materials; lapse analysis; reflection coefficient; short circuit waveguide; waveguide meter; Artificial intelligence; Bismuth; Electromagnetic analysis; Electromagnetic scattering; Electromagnetic waveguides; IEEE catalog; Microwave technology; Organizing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
Conference_Location
Sevastopol, Crimea
Print_ISBN
978-966-335-166-7
Electronic_ISBN
978-966-335-169-8
Type
conf
DOI
10.1109/CRMICO.2008.4676589
Filename
4676589
Link To Document