• DocumentCode
    3402912
  • Title

    Multimodal image fusion for next generation NDE systems

  • Author

    Algarni, Ayed ; Elshafiey, Ibrahim ; Alkanhal, Majeed A.

  • Author_Institution
    Electr. Eng. Dept., King Saud Univ., Riyadh, Saudi Arabia
  • fYear
    2009
  • fDate
    14-17 Dec. 2009
  • Firstpage
    219
  • Lastpage
    224
  • Abstract
    Advantages and limitations associated with each NDE modality raises a tradeoff in which no single modality can be identified for a particular application. The necessary elements for building an intelligent NDE system based on image fusion are introduced. An application is presented considering the fusion of optical and eddy current images. Fusion algorithms are implemented using intensity hue saturation (IHS) transform, discrete wavelet transform and IHS with shift invariant wavelet decomposition. Developed image evaluation measures (quality metrics) are adopted to cross the gap between subjective and objective evaluation, which is essential to automate NDE systems in industrial environments. Introduced quality metric depends on mean square error (RMSE), correlation (CORR), peak signal to noise ratio (PSNR) and mutual information (MI). Analysis of the developed system is presented based on experimental data.
  • Keywords
    discrete wavelet transforms; eddy current testing; image fusion; mean square error methods; discrete wavelet transform; eddy current images; fusion algorithms; intelligent NDE system; intensity hue saturation transform; mean square error; multimodal image fusion; mutual information; noise ratio; objective evaluation; peak signal; shift invariant wavelet decomposition; subjective evaluation; Discrete wavelet transforms; Eddy currents; Focusing; Image fusion; Inspection; Intelligent structures; Intelligent systems; PSNR; Spatial resolution; Wavelet analysis; Eddy current; Image fusion; Nondestructive Evaluation; Quality Metrics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing and Information Technology (ISSPIT), 2009 IEEE International Symposium on
  • Conference_Location
    Ajman
  • Print_ISBN
    978-1-4244-5949-0
  • Type

    conf

  • DOI
    10.1109/ISSPIT.2009.5407575
  • Filename
    5407575