DocumentCode :
3403199
Title :
Multi-target tracking of time-varying spatial patterns
Author :
Liu, Jingchen ; Liu, Yanxi
Author_Institution :
Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA, USA
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
1839
Lastpage :
1846
Abstract :
Time-varying spatial patterns are common, but few computational tools exist for discovering and tracking multiple, sometimes overlapping, spatial structures of targets. We propose a multi-target tracking framework that takes advantage of spatial patterns inside the targets even though the number, the form and the regularity of such patterns vary with time. RANSAC-based model fitting algorithms are developed to automatically recognize (or dismiss) (il)legitimate patterns. Patterns are represented using a mixture of Markov Random Fields (MRF) with constraints (local and global) and preferences encoded into pairwise potential functions. To handle pattern variations continuously, we introduce a posterior probability for each spatial pattern modeled as a Bernoulli distribution. Tracking is achieved by inferring the optimal state configurations of the targets using belief propagation on a mixture of MRFs. We have evaluated our formulation on real video data with multiple targets containing time-varying lattice patterns and/or reflection symmetry patterns. Experimental results of our proposed algorithm show superior tracking performance over existing methods.
Keywords :
Markov processes; image representation; target tracking; video signal processing; Bernoulli distribution; Markov random fields; RANSAC-based model fitting algorithms; belief propagation; computational tools; multitarget tracking; pairwise potential functions; time-varying lattice patterns; time-varying spatial patterns; Application software; Belief propagation; Computer science; Computer vision; Lattices; Layout; Markov random fields; Pattern recognition; Reflection; Target tracking;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
Conference_Location :
San Francisco, CA
ISSN :
1063-6919
Print_ISBN :
978-1-4244-6984-0
Type :
conf
DOI :
10.1109/CVPR.2010.5539855
Filename :
5539855
Link To Document :
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