Title :
Development of advanced diagnostic functions in very high volume automotive sensor applications
Author :
Krey, Martin ; Sabotta, Daniel ; Zahn, Fabian ; Riemschneider, Karl-Ragmar ; Rettig, Rasmus
Author_Institution :
HAW Hamburg, Univ. of Appl. Sci., Hamburg, Germany
Abstract :
We present an opportunity for an overall system improvement of a very high volume automotive application based on advanced low-level on-chip signal diagnosis. We put our focus on advanced on-sensor diagnosis and added functionality at the very lowest level close to the magnetic signal of an automotive wheel speed sensor. Besides adding diagnosis for the sensor, this enables diagnostics of the entire mechanical system including the magnetic circuit which is crucial for correct operation. We followed a pre-development path starting with extensive automated measurements, simulations, a micro-controller based implementation, a field programmable gate array (FPGA) and finally a fully integrated application specific integrated circuit (ASIC). ASIC-blocks can be used for integration in the series product. We demonstrate the low-resource implementation of a lowest level sensor diagnostic signal processing circuit based on harmonic distortion analysis. The development path is reviewed with focus on reuse in the light of the specific requirements, advantages and drawbacks of each approach.
Keywords :
application specific integrated circuits; automotive electronics; computerised instrumentation; field programmable gate arrays; harmonic distortion; microcontrollers; sensors; signal processing equipment; velocity measurement; ASIC-blocks; FPGA; advanced diagnostic functions; advanced low-level on-chip signal diagnosis; automotive wheel speed sensor; extensive automated measurements; field programmable gate array; fully integrated application specific integrated circuit; harmonic distortion analysis; magnetic circuit; microcontroller; signal processing circuit; very high volume automotive sensor applications; Abstracts; Application specific integrated circuits; CMOS integrated circuits; Harmonic analysis; Harmonic distortion; MATLAB; Protocols;
Conference_Titel :
SOC Conference (SOCC), 2013 IEEE 26th International
Conference_Location :
Erlangen
DOI :
10.1109/SOCC.2013.6749672