Title :
Fast Reconstruction Algorithms For Three-dimensional Electrical Impedance Tomography
Author :
Goble, John ; Isaacson, David
Author_Institution :
Rensselaer Polytechnic Institute
Keywords :
Conductivity; Current measurement; Electrodes; Finite difference methods; Finite element methods; Image reconstruction; Impedance; Reconstruction algorithms; Tomography; Voltage;
Conference_Titel :
Engineering in Medicine and Biology Society, 1990., Proceedings of the Twelfth Annual International Conference of the IEEE
Print_ISBN :
0-87942-559-8
DOI :
10.1109/IEMBS.1990.690987