DocumentCode :
3403281
Title :
Tutorial: Methodology for designing reliable clock networks
Author :
Taewhan Kim
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
fYear :
2013
fDate :
4-6 Sept. 2013
Firstpage :
141
Lastpage :
141
Abstract :
Summary form only given. This tutorial covers the clock network design methodology, especially focusing on the construction of robust clock under PVT (process-voltage-temperature) variation. First, the basic synthesis flow of clock networks is described with the emphasis of key factors to be considered during the design process. Second, a more in-depth analysis and the related problems caused by the PVT variation are discussed, followed by enumerating the state-of-art design and optimization techniques to address the problems. Thirdly, the diverse structures of clock networks are described, and their pros and cons are summarized with a numeric data extracted from intensive simulation. Finally, the clock design flow is moved to the area of 3D ICs, and what the unique issues to be addressed are and how they are currently solved will be presented.
Keywords :
circuit optimisation; clock distribution networks; clocks; integrated circuit design; integrated circuit reliability; three-dimensional integrated circuits; 3D ICs; clock design flow; clock network design methodology; clock networks; optimization techniques; process-voltage-temperature variation; robust clock construction; state-of-art design; Reliability engineering; Tutorials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOC Conference (SOCC), 2013 IEEE 26th International
Conference_Location :
Erlangen
ISSN :
2164-1676
Type :
conf
DOI :
10.1109/SOCC.2013.6749676
Filename :
6749676
Link To Document :
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