DocumentCode
3403281
Title
Tutorial: Methodology for designing reliable clock networks
Author
Taewhan Kim
Author_Institution
Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
fYear
2013
fDate
4-6 Sept. 2013
Firstpage
141
Lastpage
141
Abstract
Summary form only given. This tutorial covers the clock network design methodology, especially focusing on the construction of robust clock under PVT (process-voltage-temperature) variation. First, the basic synthesis flow of clock networks is described with the emphasis of key factors to be considered during the design process. Second, a more in-depth analysis and the related problems caused by the PVT variation are discussed, followed by enumerating the state-of-art design and optimization techniques to address the problems. Thirdly, the diverse structures of clock networks are described, and their pros and cons are summarized with a numeric data extracted from intensive simulation. Finally, the clock design flow is moved to the area of 3D ICs, and what the unique issues to be addressed are and how they are currently solved will be presented.
Keywords
circuit optimisation; clock distribution networks; clocks; integrated circuit design; integrated circuit reliability; three-dimensional integrated circuits; 3D ICs; clock design flow; clock network design methodology; clock networks; optimization techniques; process-voltage-temperature variation; robust clock construction; state-of-art design; Reliability engineering; Tutorials;
fLanguage
English
Publisher
ieee
Conference_Titel
SOC Conference (SOCC), 2013 IEEE 26th International
Conference_Location
Erlangen
ISSN
2164-1676
Type
conf
DOI
10.1109/SOCC.2013.6749676
Filename
6749676
Link To Document