• DocumentCode
    3403281
  • Title

    Tutorial: Methodology for designing reliable clock networks

  • Author

    Taewhan Kim

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
  • fYear
    2013
  • fDate
    4-6 Sept. 2013
  • Firstpage
    141
  • Lastpage
    141
  • Abstract
    Summary form only given. This tutorial covers the clock network design methodology, especially focusing on the construction of robust clock under PVT (process-voltage-temperature) variation. First, the basic synthesis flow of clock networks is described with the emphasis of key factors to be considered during the design process. Second, a more in-depth analysis and the related problems caused by the PVT variation are discussed, followed by enumerating the state-of-art design and optimization techniques to address the problems. Thirdly, the diverse structures of clock networks are described, and their pros and cons are summarized with a numeric data extracted from intensive simulation. Finally, the clock design flow is moved to the area of 3D ICs, and what the unique issues to be addressed are and how they are currently solved will be presented.
  • Keywords
    circuit optimisation; clock distribution networks; clocks; integrated circuit design; integrated circuit reliability; three-dimensional integrated circuits; 3D ICs; clock design flow; clock network design methodology; clock networks; optimization techniques; process-voltage-temperature variation; robust clock construction; state-of-art design; Reliability engineering; Tutorials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOC Conference (SOCC), 2013 IEEE 26th International
  • Conference_Location
    Erlangen
  • ISSN
    2164-1676
  • Type

    conf

  • DOI
    10.1109/SOCC.2013.6749676
  • Filename
    6749676