Title :
On-line semi-supervised multiple-instance boosting
Author :
Zeisl, Bernhard ; Leistner, Christian ; Saffari, Amir ; Bischof, Horst
Author_Institution :
Inst. for Comput. Graphics & Vision, Tech. Univ. Graz, Graz, Austria
Abstract :
A recent dominating trend in tracking called tracking-by-detection uses on-line classifiers in order to redetect objects over succeeding frames. Although these methods usually deliver excellent results and run in real-time they also tend to drift in case of wrong updates during the self-learning process. Recent approaches tackled this problem by formulating tracking-by-detection as either one-shot semi-supervised learning or multiple instance learning. Semi-supervised learning allows for incorporating priors and is more robust in case of occlusions while multiple-instance learning resolves the uncertainties where to take positive updates during tracking. In this work, we propose an on-line semi-supervised learning algorithm which is able to combine both of these approaches into a coherent framework. This leads to more robust results than applying both approaches separately. Additionally, we introduce a combined loss that simultaneously uses labeled and unlabeled samples, which makes our tracker more adaptive compared to previous on-line semi-supervised methods. Experimentally, we demonstrate that by using our semi-supervised multiple-instance approach and utilizing robust learning methods, we are able to outperform state-of-the-art methods on various benchmark tracking videos.
Keywords :
image classification; learning (artificial intelligence); object detection; optical tracking; multiple instance learning; object redetection; occlusion; online classifier; online semisupervised learning algorithm; online semisupervised multiple-instance boosting; robust learning method; self-learning process; tracking-by-detection; Boosting; Computational geometry; Computer graphics; Computer vision; Learning systems; Particle tracking; Robustness; Semisupervised learning; Uncertainty; Videos;
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-6984-0
DOI :
10.1109/CVPR.2010.5539860