Title :
A new static test of a DAC with a built-in structure
Author :
Incheol Kim ; Jaewon Jang ; HyeonUk Son ; Sungho Kang
Author_Institution :
Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
Abstract :
A new BIST (Built-In Self-Test) scheme to test static parameters of a DAC (Digital-to-Analog Converter) is proposed in this paper. The proposed BIST employs a ramp generator and two voltage references to calculate static parameters of a DAC such as offset, gain, INL (Integral Non-Linearity) and DNL(Differential Non-Linearity). The optimization of calculating static parameters and the element sharing can reduce the BIST circuitry. The simulation results which validate our method are able to detect the linearity errors with the simple hardware architecture.
Keywords :
built-in self test; circuit testing; digital-analogue conversion; BIST circuitry; BIST scheme; DAC static test; built-in self-test scheme; digital-to-analog converter; element sharing; linearity errors; ramp generator; voltage references; Clocks; Europe;
Conference_Titel :
Circuits and Systems (MWSCAS), 2011 IEEE 54th International Midwest Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-61284-856-3
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2011.6026361
