Design-for-testability automation of mixed-signal integrated circuits

Author

Mosin, Sergey

Author_Institution

Comput. Eng. Dept., Vladimir State Univ. (VSU), Vladimir, Russia

fYear

2013

fDate

4-6 Sept. 2013

Firstpage

244

Lastpage

249

Abstract

The methodology to computer-aided design-for-testability (DFT) of mixed-signal IC is proposed. Functional model of DFT-automation is presented as IDEF0-diagram based on the system analysis. The purpose and principal realization of the key DFT processes in the model are considered. The decision criterions of effective DFT-solution for particular mixed-signal circuit design are proposed. The features of testing circuitries library are descried. Experimental results of the methodology application for analog-digital ADPCM codec are presented.

Keywords

adaptive codes; adaptive modulation; circuit CAD; design for testability; differential pulse code modulation; integrated circuit design; mixed analogue-digital integrated circuits; DFT-automation; IDEF0-diagram; analog-digital ADPCM codec application; computer-aided design-for-testability; decision criterions; functional model; mixed-signal circuit design; mixed-signal integrated circuits; system analysis; testing circuitries library; Abstracts; Circuit faults; Couplings; Dictionaries; Estimation; Integrated circuit modeling; Standards;

fLanguage

English

Publisher

ieee

Conference_Titel

SOC Conference (SOCC), 2013 IEEE 26th International

Conference_Location

Erlangen

ISSN

2164-1676

Type

conf

DOI

10.1109/SOCC.2013.6749695

Filename

6749695