Title :
Exploring the opportunity of optimizing sequencing elements in ASIC designs
Author :
Seungwhun Paik ; Jaeha Kung ; Youngsoo Shin
Author_Institution :
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
Abstract :
An edge-triggered flip-flop is a de facto standard sequencing element in ASIC designs. As sequencing elements occupy increasing portion of timing and power, it is necessary to explore other types of elements. We identify pulsed-latch and dual edge-triggered flip-flop as two promising candidates. The challenges when they are employed for conventional ASIC design are identified, and potential solutions are addressed.
Keywords :
application specific integrated circuits; flip-flops; integrated circuit design; ASIC designs; dual-edge-triggered flip-flop; pulsed-latch flip-flop; sequencing element optimization; Flip-flops; Latches; Logic gates; Optimization; Robustness;
Conference_Titel :
Circuits and Systems (MWSCAS), 2011 IEEE 54th International Midwest Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-61284-856-3
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2011.6026379