DocumentCode
3403883
Title
High efficient Direct Binary Search using Multiple Lookup Tables
Author
Jing-Ming Guo ; Yun-Fu Liu ; Jla-Yu Chang
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
fYear
2012
fDate
Sept. 30 2012-Oct. 3 2012
Firstpage
813
Lastpage
816
Abstract
Look-Up Table (LUT) halftoning is an efficient way to construct halftone images, and approximately simulate the dot distribution of the learned halftone image set. In this study, a general mechanism named Multiple Look-Up Table (MLUT) halftoning is proposed to generate the halftones of Direct Binary Search (DBS), while the high efficient characteristic of the LUT is still preserved. In the MLUT, the standard deviation is adopted as an important feature to classify various tables. Moreover, the proposed Quick Standard Deviation Evaluation (QSDE) is employed to yield an extremely low computational complexity in calculating the standard deviation. In the parameter optimization, the autocorrelation is adopted since it can fully characterize the periodicity of dot distribution. Experimental results demonstrate that the visual quality of the proposed method can approximate to that of the DBS which is considered as the best halftoning in terms of image quality, which enable the proposed scheme as a very competitive candidate in coping printing industry.
Keywords
computational complexity; image processing; printing industry; search problems; table lookup; autocorrelation; computational complexity; dot distribution; halftone images; high efficient direct binary search; image quality; learned halftone image set; multiple look-up table halftoning; multiple lookup tables; parameter optimization; printing industry; quick standard deviation evaluation; visual quality; Computational complexity; Correlation; Gray-scale; Satellite broadcasting; Standards; Table lookup; Training; DBS; Halftone; Look-Up Table (LUT); integral image; standard deviation;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2012 19th IEEE International Conference on
Conference_Location
Orlando, FL
ISSN
1522-4880
Print_ISBN
978-1-4673-2534-9
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2012.6466984
Filename
6466984
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