• DocumentCode
    3403948
  • Title

    Design automation flow for voltage adaptive optimum granularity LITHE for sequential circuits

  • Author

    Balasubramanian, Venkat Krishnan ; Hao Xu ; Vemuri, Ranga

  • Author_Institution
    Sch. of Electron. & Comput. Syst., Univ. of Cincinnati, Cincinnati, OH, USA
  • fYear
    2013
  • fDate
    4-6 Sept. 2013
  • Firstpage
    355
  • Lastpage
    360
  • Abstract
    Runtime Active Leakage Control (RALC) techniques like Power Gating (PG) and Reverse Body Biasing (RBB) being the primary candidates, several novel techniques such as Light Vth Hopping (LITHE) [3] with reduced substrate biasing have proven to be beneficial. The intention of LITHE is to reduce the Energy Breakeven Time (EBT) of the circuit, leading to frequent application of RBB. There are several problems that arise while integrating LITHE in a design flow. In this paper, a generic flow from RTL to spice incorporating the LITHE technique at near-optimum granularity is proposed. The problems of control transistor sizing and control signal generation is also addressed. A preprocessing clustering algorithm is applied to extend LITHE technique to sequential circuits. The entire flow has been developed using a 90 nm library developed from Synopsys PDK and has been verified on designs with varying complexities.
  • Keywords
    logic design; sequential circuits; EBT; LITHE technique; PG; RALC technique; RBB; RBB frequent application; Synopsys PDK; control signal generation; control transistor sizing; design automation flow; energy breakeven time; generic flow; light threshold hopping; near-optimum granularity; power gating; preprocessing clustering algorithm; reduced substrate biasing; reverse body biasing; runtime active leakage control technique; sequential circuits; size 90 nm; voltage adaptive optimum granularity LITHE; Benchmark testing; Clocks; Complexity theory; Cooling; Educational institutions; Lead; Logic gates; LITHE; Leakage Reduction; Low Power; RBB;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOC Conference (SOCC), 2013 IEEE 26th International
  • Conference_Location
    Erlangen
  • ISSN
    2164-1676
  • Type

    conf

  • DOI
    10.1109/SOCC.2013.6749715
  • Filename
    6749715