Title :
A study on continuous max-flow and min-cut approaches
Author :
Yuan, Jing ; Bae, Egil ; Tai, Xue-Cheng
Author_Institution :
Comput. Sci. Dept., Univ. of Western Ontario, London, ON, Canada
Abstract :
We propose and study novel max-flow models in the continuous setting, which directly map the discrete graph-based max-flow problem to its continuous optimization formulation. We show such a continuous max-flow model leads to an equivalent min-cut problem in a natural way, as the corresponding dual model. In this regard, we revisit basic conceptions used in discrete max-flow / min-cut models and give their new explanations from a variational perspective. We also propose corresponding continuous max-flow and min-cut models constrained by priori supervised information and apply them to interactive image segmentation/labeling problems. We prove that the proposed continuous max-flow and min-cut models, with or without supervised constraints, give rise to a series of global binary solutions λ*(x) ϵ {0,1}, which globally solves the original nonconvex image partitioning problems. In addition, we propose novel and reliable multiplier-based max-flow algorithms. Their convergence is guaranteed by classical optimization theories. Experiments on image segmentation, unsupervised and supervised, validate the effectiveness of the discussed continuous max-flow and min-cut models and suggested max-flow based algorithms.
Keywords :
concave programming; graph theory; image segmentation; minimax techniques; classical optimization theory; continuous max-flow approach; continuous optimization formulation; discrete graph-based max-flow problem; image labeling problems; interactive image segmentation problem; min-cut approaches; multiplier-based max-flow algorithms; nonconvex image partitioning problems; Application software; Computer science; Computer vision; Educational institutions; Image segmentation; Labeling; Mathematical model; Mathematics; Minimization methods; Partitioning algorithms;
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-6984-0
DOI :
10.1109/CVPR.2010.5539903