DocumentCode
3404259
Title
Dense interest points
Author
Tuytelaars, Tinne
Author_Institution
ESAT-PSI, K.U. Leuven, Leuven, Germany
fYear
2010
fDate
13-18 June 2010
Firstpage
2281
Lastpage
2288
Abstract
Local features or image patches have become a standard tool in computer vision, with numerous application domains. Roughly speaking, two different types of patch-based image representations can be distinguished: interest points, such as corners or blobs, whose position, scale and shape are computed by a feature detector algorithm, and dense sampling, where patches of fixed size and shape are placed on a regular grid (possibly repeated over multiple scales). Interest points focus on `interesting´ locations in the image and include various degrees of viewpoint and illumination invariance, resulting in better repeatability scores. Dense sampling, on the other hand, gives a better coverage of the image, a constant amount of features per image area, and simple spatial relations between features. In this paper, we propose a hybrid scheme, which we call dense interest points, where we start from densely sampled patches yet optimize their position and scale parameters locally. We investigate whether doing so it is possible to get the best of both worlds.
Keywords
feature extraction; image recognition; image representation; optimisation; computer vision; dense interest points; dense sampling; feature detector algorithm; image patches; image representations; Application software; Computer vision; Detectors; Feature extraction; Image representation; Image sampling; Layout; Lighting; Object recognition; Shape;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
Conference_Location
San Francisco, CA
ISSN
1063-6919
Print_ISBN
978-1-4244-6984-0
Type
conf
DOI
10.1109/CVPR.2010.5539911
Filename
5539911
Link To Document