• DocumentCode
    3404495
  • Title

    Detection of transient power quality disturbances based EMD combined with Choi-Williams distribution

  • Author

    Liu, Wei ; Guo, Xiaoting

  • Author_Institution
    Sch. of Electron. Inf. Eng., Henan Univ. of Sci. & Technol., Luoyang, China
  • fYear
    2012
  • fDate
    15-17 Aug. 2012
  • Firstpage
    588
  • Lastpage
    591
  • Abstract
    To suppress the cross terms interference in the Cohen class quadratic time-frequency distribution, a method based on empirical mode decomposition (EMD) and Choi-Williams distribution is proposed. In this method, the time domain signal is decomposed into intrinsic mode functions (IMFs) by EMD in frequency domain. It calculates Cohen class distribution after deleting the false components generated by EMD, and then the Cohen class distribution of original signal is reconstructed by superposing the results of IMFs to the original signal linearly. The simulation results show that the method is effective to suppress the cross terms of Cohen class Distribution, ensure Cohen class Distribution time-frequency concentration, and extract features of disturbance.
  • Keywords
    feature extraction; frequency-domain analysis; power supply quality; power system transients; signal processing; statistical distributions; Choi-Williams distribution; Cohen class quadratic time-frequency distribution; cross term interference; empirical mode decomposition; feature extraction; frequency domain analysis; intrinsic mode function; time domain signal; transient power quality detection; Educational institutions; Kernel; Power quality; Time frequency analysis; Transient analysis; Voltage fluctuations; Choi-Williams distribution; cross term; empirical mode decomposition; intrinsic mode function; power quality disturbances;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automation and Logistics (ICAL), 2012 IEEE International Conference on
  • Conference_Location
    Zhengzhou
  • ISSN
    2161-8151
  • Print_ISBN
    978-1-4673-0362-0
  • Electronic_ISBN
    2161-8151
  • Type

    conf

  • DOI
    10.1109/ICAL.2012.6308146
  • Filename
    6308146