Title :
Application of and rating structure for ground and test devices used in metal-clad switchgear
Author :
Bridger, Baldwin, Jr.
Author_Institution :
Powell Electr. Manuf. Co., Houston, TX, USA
Abstract :
Ground and test devices are accessories for use in grounding and testing the primary conductors in metal-clad switchgear. The author describes the types commonly available and their use. He notes that these devices are not covered by an existing standards and examines rating structures and test requirements that should apply to them. The creation of a standard to cover ground and test devices is proposed.<>
Keywords :
earthing; switchgear; ground devices; grounding; metal-clad switchgear; primary conductors; rating structure; test devices; Conductors; Grounding; Switchgear; Testing;
Conference_Titel :
Industry Applications Society Annual Meeting, 1988., Conference Record of the 1988 IEEE
Conference_Location :
Pittsburgh, PA, USA
DOI :
10.1109/IAS.1988.25258
