Title :
Adaptive feedback cancellation for audio signals using a warped all-pole near-end signal model
Author :
Van Waterschoot, Toon ; Moonen, Marc
Author_Institution :
Katholieke Univ. Leuven, Leuven
fDate :
March 31 2008-April 4 2008
Abstract :
Sound amplification systems having a closed signal loop often suffer from acoustic feedback, which limits the achievable amount of amplification and severely affects sound quality. A promising solution to the feedback problem consists in predicting the feedback signal using an adaptive filter, however, a bias is then introduced due to signal correlation. In speech applications, a prediction-error-method- based approach to adaptive feedback cancellation has proven to be capable of providing sufficient decorrelation without sacrificing speech quality. This approach, which is based on estimating an all-pole near-end signal model, appears to be unappropriate for musical audio signals because of their large degree of tonality. We propose a novel prediction-error-method-based adaptive feedback cancellation algorithm that features a frequency-warped all-pole near-end signal model, which is better suited for tonal audio signals. Simulation results show a doubling of the convergence speed, with only a relatively small increase in computational complexity.
Keywords :
adaptive filters; audio signal processing; prediction theory; acoustic feedback; adaptive feedback cancellation; adaptive filter; computational complexity; decorrelation; musical audio signal; prediction error method; signal correlation; sound amplification system; speech quality; tonal audio signal; warped all-pole near-end signal model; Acoustic applications; Adaptive filters; Automatic frequency control; Decorrelation; Feedback control; Feedback loop; Loudspeakers; Microphones; Signal processing algorithms; Speech; Acoustic feedback; adaptive filters; audio signal processing; prediction error identification; warped linear prediction;
Conference_Titel :
Acoustics, Speech and Signal Processing, 2008. ICASSP 2008. IEEE International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4244-1483-3
Electronic_ISBN :
1520-6149
DOI :
10.1109/ICASSP.2008.4517598