Title :
Near-field scanning optical microscopic studies of micro-ring resonators
Author :
Vander Rhodes, Gregory H. ; Goldberg, Bennett B. ; Ünlü, M. Selim ; Chu, Sai-Tak ; Little, Brent E.
Author_Institution :
Dept. of Phys., Boston Univ., MA, USA
Abstract :
Near-field Scanning Optical Microscopy has been used to measure internal optical modes in channel waveguides and ring resonators. The period of the observed standing modes is a direct measure of the effective index
Keywords :
integrated optics; micro-optics; near-field scanning optical microscopy; optical resonators; optical waveguides; channel waveguides; effective index; internal optical modes; micro-ring resonators; near-field scanning optical microscopic studies; standing modes; Integrated optics; Optical devices; Optical filters; Optical microscopy; Optical resonators; Optical ring resonators; Optical scattering; Optical signal processing; Optical surface waves; Optical waveguides;
Conference_Titel :
LEOS '99. IEEE Lasers and Electro-Optics Society 1999 12th Annual Meeting
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-5634-9
DOI :
10.1109/LEOS.1999.811846
