DocumentCode
3404773
Title
Near-field scanning optical microscopic studies of micro-ring resonators
Author
Vander Rhodes, Gregory H. ; Goldberg, Bennett B. ; Ünlü, M. Selim ; Chu, Sai-Tak ; Little, Brent E.
Author_Institution
Dept. of Phys., Boston Univ., MA, USA
Volume
2
fYear
1999
fDate
1999
Firstpage
552
Abstract
Near-field Scanning Optical Microscopy has been used to measure internal optical modes in channel waveguides and ring resonators. The period of the observed standing modes is a direct measure of the effective index
Keywords
integrated optics; micro-optics; near-field scanning optical microscopy; optical resonators; optical waveguides; channel waveguides; effective index; internal optical modes; micro-ring resonators; near-field scanning optical microscopic studies; standing modes; Integrated optics; Optical devices; Optical filters; Optical microscopy; Optical resonators; Optical ring resonators; Optical scattering; Optical signal processing; Optical surface waves; Optical waveguides;
fLanguage
English
Publisher
ieee
Conference_Titel
LEOS '99. IEEE Lasers and Electro-Optics Society 1999 12th Annual Meeting
Conference_Location
San Francisco, CA
ISSN
1092-8081
Print_ISBN
0-7803-5634-9
Type
conf
DOI
10.1109/LEOS.1999.811846
Filename
811846
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