• DocumentCode
    3404884
  • Title

    A methodology to enhance electromagnetic compatibility in joint military operations

  • Author

    Buckellew, William

  • Author_Institution
    Joint Test Force, OSD, Eglin AFB, FL, USA
  • fYear
    1990
  • fDate
    21-23 Aug 1990
  • Firstpage
    33
  • Lastpage
    37
  • Abstract
    The methodology identifies potential EMI (electromagnetic interference) problems using results from field operations, historical data bases, and analytical modeling. Operational expertise, engineering analysis, and testing are used to characterize and prioritize the potential EMI problems. Results can be used to resolve potential EMI during the development and acquisition of new systems and to develop engineering fixes and operational workarounds for systems already employed. The analytic modeling portion of the methodology is a predictive process that uses progressive refinement of the analysis and the operational electronic environment to eliminate noninterfering equipment pairs, defer further analysis on pairs lacking operational significance, and resolve the remaining EMI problems. Tests are conducted on equipment pairs to ensure that the analytical models provide a realistic description of the predicted interference
  • Keywords
    electromagnetic compatibility; electromagnetic interference; military systems; EMC; EMI problems; JEMI methodology; analytical modeling; electromagnetic compatibility; electromagnetic interference; electronic environment; engineering fixes; field operations; historical data bases; joint EMI; joint military operations; noninterfering equipment pairs; operational workarounds; predictive process; progressive refinement; Aerospace electronics; Analytical models; Data analysis; Electromagnetic compatibility; Electromagnetic interference; Electronic countermeasures; Electronic equipment testing; Predictive models; System testing; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1990. Symposium Record., 1990 IEEE International Symposium on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-7264-6
  • Type

    conf

  • DOI
    10.1109/ISEMC.1990.252727
  • Filename
    252727