• DocumentCode
    3404886
  • Title

    A blind noise decorrelation approach with crystal arrays on designing post-filters for diffuse noise suppression

  • Author

    Ito, Nobutaka ; Ono, Nobutaka ; Sagayama, Shigeki

  • Author_Institution
    Grad. Sch. of Inf. Sci. & Technol., Univ. of Tokyo, Tokyo
  • fYear
    2008
  • fDate
    March 31 2008-April 4 2008
  • Firstpage
    317
  • Lastpage
    320
  • Abstract
    This paper describes a new framework for extracting the target signal in diffuse noise environments. We utilize crystal arrays, a certain class of symmetrical microphone arrays with crystal-like geometries, which enable interchannel decorrelation of isotropic noise without knowing the value of its covariance matrix. We refer to this decorrelation as blind noise decorrelation. Using an improved estimation of the signal power spectrum obtained by the blind noise decorrelation, the multichannel Wiener filter is properly implemented, which is the optimal estimator of the target signal in the minimum mean square error sense. Simulated experiments have shown the effectiveness of the proposed method.
  • Keywords
    Wiener filters; acoustic signal processing; array signal processing; covariance matrices; decorrelation; least mean squares methods; microphone arrays; signal denoising; blind noise decorrelation approach; covariance matrix; crystal arrays; crystal-like geometries; designing post-filters; diffuse noise suppression; interchannel decorrelation; minimum mean square error sense; multichannel Wiener filter; signal power spectrum; symmetrical microphone arrays; target signal; Array signal processing; Covariance matrix; Decorrelation; Geometry; Indium tin oxide; Low-frequency noise; Mean square error methods; Microphone arrays; Wiener filter; Working environment noise; Array signal processing; covariance matrix; diffuse noise; post-filter; power spectrum estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics, Speech and Signal Processing, 2008. ICASSP 2008. IEEE International Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1520-6149
  • Print_ISBN
    978-1-4244-1483-3
  • Electronic_ISBN
    1520-6149
  • Type

    conf

  • DOI
    10.1109/ICASSP.2008.4517610
  • Filename
    4517610