DocumentCode :
3404924
Title :
Efficient additive kernels via explicit feature maps
Author :
Vedaldi, Andrea ; Zisserman, Andrew
Author_Institution :
Dept. of Eng. Sci., Univ. of Oxford, Oxford, UK
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
3539
Lastpage :
3546
Abstract :
Maji and Berg have recently introduced an explicit feature map approximating the intersection kernel. This enables efficient learning methods for linear kernels to be applied to the non-linear intersection kernel, expanding the applicability of this model to much larger problems. In this paper we generalize this idea, and analyse a large family of additive kernels, called homogeneous, in a unified framework. The family includes the intersection, Hellinger´s, and χ2 kernels commonly employed in computer vision. Using the framework we are able to: (i) provide explicit feature maps for all homogeneous additive kernels along with closed form expression for all common kernels; (ii) derive corresponding approximate finite-dimensional feature maps based on the Fourier sampling theorem; and (iii) quantify the extent of the approximation. We demonstrate that the approximations have indistinguishable performance from the full kernel on a number of standard datasets, yet greatly reduce the train/test times of SVM implementations. We show that the χ2 kernel, which has been found to yield the best performance in most applications, also has the most compact feature representation. Given these train/test advantages we are able to obtain a significant performance improvement over current state of the art results based on the intersection kernel.
Keywords :
Fourier analysis; computer vision; self-organising feature maps; support vector machines; Fourier sampling theorem; Hellinger kernel; SVM implementations; computer vision; efficient additive kernels; explicit feature map; finite-dimensional feature maps; intersection kernel; nonlinear intersection kernel; Computer vision; Histograms; Kernel; Large-scale systems; Learning systems; Machine learning; Probability distribution; Sampling methods; Support vector machines; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
Conference_Location :
San Francisco, CA
ISSN :
1063-6919
Print_ISBN :
978-1-4244-6984-0
Type :
conf
DOI :
10.1109/CVPR.2010.5539949
Filename :
5539949
Link To Document :
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